3 February 2015 Iodine flow rate measurement for COIL with the chemical iodine generator based on absorption spectroscopy
Author Affiliations +
Proceedings Volume 9255, XX International Symposium on High-Power Laser Systems and Applications 2014; 92552J (2015) https://doi.org/10.1117/12.2065353
Event: XX International Symposium on High Power Laser Systems and Applications, 2014, Chengdu, China
Abstract
A dual-components absorption method based on absorption spectroscopy was described in the paper. It can easily eliminate the influence of the serious contamination and aerosol scattering on IFR measurement by utilizing the absorptions of iodine vapor and chlorine on two different wavelengths respectively. According to the character that there is no other gaseous product in the reaction besides iodine vapor, IFR in real time can be obtained by the connections of the pressure and the flow rate among chlorine remainder, iodine vapor, and the buffer gas. We used this method to measure IFR for the first time at the exit of a chemical iodine generator. The average of IFR is coincident with that calculated by chemical weighting mass.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Weili Zhao, Weili Zhao, Yuelong Zhang, Yuelong Zhang, Peng Zhang, Peng Zhang, Mingxiu Xu, Mingxiu Xu, Yuqi Jin, Yuqi Jin, Fengting Sang, Fengting Sang, "Iodine flow rate measurement for COIL with the chemical iodine generator based on absorption spectroscopy", Proc. SPIE 9255, XX International Symposium on High-Power Laser Systems and Applications 2014, 92552J (3 February 2015); doi: 10.1117/12.2065353; https://doi.org/10.1117/12.2065353
PROCEEDINGS
6 PAGES


SHARE
RELATED CONTENT

High pressure COIL problem
Proceedings of SPIE (February 12 1996)
BHP jet stabilization of COIL
Proceedings of SPIE (January 24 2001)
The auto decomposition of NCl<sub>3< sub> as a source of...
Proceedings of SPIE (February 22 2006)
Oxygen-iodine laser research at RFNC-VNIIEF
Proceedings of SPIE (December 21 1998)

Back to Top