Focus-grid-based wide field-of-view microscope has been developed to break the trade-off of resolution and field of view in conventional microscopy. In the wide field-of-view microscopy, the whole sample area has to be scanned with at least Nyquist-frequency sampling for image reconstruction. We propose a novel scanning mechanism using compressive sensing (CS), where the scanning of focal spots covers only a portion of the sample. Our preliminary studies show that 75% of scanning area is enough to reconstruct a decent image. Thus we can reduce the acquisition data which allow for simpler scanning mechanism and data acquisition.