18 November 2014 Wide field-of-view microscopy using compressive sensing
Author Affiliations +
Abstract
Focus-grid-based wide field-of-view microscope has been developed to break the trade-off of resolution and field of view in conventional microscopy. In the wide field-of-view microscopy, the whole sample area has to be scanned with at least Nyquist-frequency sampling for image reconstruction. We propose a novel scanning mechanism using compressive sensing (CS), where the scanning of focal spots covers only a portion of the sample. Our preliminary studies show that 75% of scanning area is enough to reconstruct a decent image. Thus we can reduce the acquisition data which allow for simpler scanning mechanism and data acquisition.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jie Wang, Jie Wang, Jigang Wu, Jigang Wu, } "Wide field-of-view microscopy using compressive sensing", Proc. SPIE 9268, Optics in Health Care and Biomedical Optics VI, 926811 (18 November 2014); doi: 10.1117/12.2071601; https://doi.org/10.1117/12.2071601
PROCEEDINGS
6 PAGES


SHARE
Back to Top