Correction of refraction index based on adjacent pulse repetition interval lengths

Dong Wei; Masato Aketagawa

doi:10.1117/12.2069828

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13 November 2014 Correction of refraction index based on adjacent pulse repetition interval lengths

Dong Wei, Masato Aketagawa

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Proceedings Volume 9276, Optical Metrology and Inspection for Industrial Applications III; 92761C (2014) https://doi.org/10.1117/12.2069828
Event: SPIE/COS Photonics Asia, 2014, Beijing, China

Abstract

Correction of refraction index is important for length measurement. The two-color method has been widely used for correction. The wavelengths of lasers have been used as a ruler of that. Based on the analogy between the wavelength and the adjacent pulse repetition interval length (APRIL), in this paper we investigate the possibility of two-color method based on adjacent pulse repetition interval lengths. Since the wavelength-based two-color method can eliminate the inhomogeneous disturbance of effects caused by the phase refractive index, therefore the APRIL-based two-color method can eliminate the air turbulence of errors induced by the group refractive index. Our analysis will contribute to high-precision length measurement.

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Dong Wei and Masato Aketagawa "Correction of refraction index based on adjacent pulse repetition interval lengths", Proc. SPIE 9276, Optical Metrology and Inspection for Industrial Applications III, 92761C (13 November 2014); https://doi.org/10.1117/12.2069828

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