6 August 2014 Research on mid-frequency errors in Nd-doped glass continuous polishing
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Proceedings Volume 9281, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies; 92810K (2014) https://doi.org/10.1117/12.2069765
Event: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2014), 2014, Harbin, China
Abstract
In the inertial confinement fusion (ICF) system, the mid-frequency errors of optical components will cause high-frequency modulation and nonlinear gain of laser beams. In this paper, theoretical simulations and experiments have been designed and operated, aiming at studying the effects of slotting methods on mid-frequency errors in Nd-doped glass continuous polishing. Based on Preston formula, theoretical simulations focus on the effects of slotting methods on the mid-frequency errors. The simulation results show that different slotting methods will cause different mid-frequency errors, and square and logarithmic shape grooves are easier to obtain smaller mid-frequency errors. On the basis of simulation results, two groups of experiments are carried out to do the Nd-doped glass continuous polishing. The results show that the mid-frequency error gradually decreases with the decrease of the spacing between grooves. The results also show that square shape groove is easier to get a smaller mid-frequency error than circular shape groove, which verifies the theoretical simulation results.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jun Cao, Jun Cao, Aihuan Dun, Aihuan Dun, Chaoyang Wei, Chaoyang Wei, Jianxun Gu, Jianxun Gu, Jianda Shao, Jianda Shao, } "Research on mid-frequency errors in Nd-doped glass continuous polishing", Proc. SPIE 9281, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 92810K (6 August 2014); doi: 10.1117/12.2069765; https://doi.org/10.1117/12.2069765
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