18 September 2014 Test diffraction properties of reflection waveguide holograms
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Proceedings Volume 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 928202 (2014) https://doi.org/10.1117/12.2069496
Event: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2014), 2014, Harbin, China
Abstract
Waveguide holograms’ diffraction properties include peak-wavelength and diffraction efficiency, which play important role in determine their display performance. Based on the record and reconstruction theory of reflection waveguide holograms, a novel experimental method for testing diffraction properties is introduced and analyzed in this paper. An experiment is implemented and the result indicated that the measured value corresponds well with the designed value.
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Yi Xie, Ming-Wu Kang, Ning Zhang, Bao-Ping Wang, "Test diffraction properties of reflection waveguide holograms", Proc. SPIE 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 928202 (18 September 2014); doi: 10.1117/12.2069496; https://doi.org/10.1117/12.2069496
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