18 September 2014 The applied research and solar simulation spectral design based on pulse xenon lamp with coating film
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Proceedings Volume 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 928207 (2014) https://doi.org/10.1117/12.2069996
Event: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2014), 2014, Harbin, China
Abstract
In the paper the spectrum of realistic sunlight and pulse xenon lamp were compared to each other, the result shows that the infrared part of luminescence spectrum of xenon lamp without coating film occupies the total spectrum’s 57.4%, but the infrared part of the standard solar spectrum only reaches to 28.3%. The transmittance curve of pulse xenon lamp is got by fitting. Using appropriate method and coating film parameter, the film is done to pulse xenon lamp, and the negative film coefficient transmittance is 16% is got at 935nm central wavelength. At the range of 400-760nm wavelength the average transmittance is more than 86%, and the average transmittance is more than 96% at the range of 400-760nm wavelength. A portion of infrared light can be filtered after coating film. By the spectral testing of two coating film xenon lamp, it can be found that the spectral matching rate is from 0.792 to 1.176 and it is satisfied to A grade standard request. By using A and C grade pulse xenon lamp electric performance of 40.5W thin film cell is tested and the power value by C grade simulative light source is lower than real power for 11.2W. The result indicates the spectral matching rate of solar simulator is very important for cell electric performance.
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Wenzhi Chen, Wenzhi Chen, Qijin Cheng, Qijin Cheng, Fengyan Zhang, Fengyan Zhang, } "The applied research and solar simulation spectral design based on pulse xenon lamp with coating film", Proc. SPIE 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 928207 (18 September 2014); doi: 10.1117/12.2069996; https://doi.org/10.1117/12.2069996
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