18 September 2014 Design and analysis of cryogenic infrared target
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Proceedings Volume 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 92820B (2014) https://doi.org/10.1117/12.2069910
Event: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2014), 2014, Harbin, China
Abstract
The cryogenic infrared target is a device used to correct the response linearity and non uniformity of infrared products (detector). Cryogenic infrared target needs wide temperature variation range as well as a stable and uniform temperature distribution in a larger area. The cryogenic infrared target also demands other excellent performances such as high temperature control precision and faster rate of temperature change. This paper discuss and analysis the working principle and key technology of the cryogenic infrared target. The analysis and test results showed that temperature of the divice can change from 80K to 300K and temperature uniformity was less than 0.2K and temperature precision was less than 0.2K and temperature stability was less than 0.2K/min. The structure of cryogenic infrared target was designed reasonably. Its index meets the design requirement.
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Zhong-hui Hu, Chao Wang, Zhen-qi Liu, "Design and analysis of cryogenic infrared target", Proc. SPIE 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 92820B (18 September 2014); doi: 10.1117/12.2069910; https://doi.org/10.1117/12.2069910
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