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18 September 2014 Measurement of image plane illumination uniformity of photoelectric imaging system
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Proceedings Volume 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 92822O (2014) https://doi.org/10.1117/12.2067909
Event: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2014), 2014, Harbin, China
Abstract
The image plane illumination nonuniformity caused by optical system or detector will affect the detection precision of photoelectric imaging system, especially in image guidance, positioning and recognition. An image plane illumination uniformity measurement device was set up, which was characteristiced of high uniformity and wide dynamic range. The device was composed of an asymmetric integrating sphere,the image collection and processing system, as well as the electrical control system.The asymmetric integrating sphere had two different radius,which was respectively 800mm and 1000mm.The spectral region was (0.4~1.1)μm, the illumination range was (1×10-4~2×104)lx. The image collection and processing system had two different acquisition card,which were respectively used for analog and digital signals. The software can process for dynamic image or static image. The TracePro software was used to make a internal ray tracing of integrating sphere, the illumination uniformity at the export was simulated for the size of 330mm×230mm and Φ 100mm export, the results were respectively 97.95% and 98.33%. Then,an illuminometer was used to measure the actual illumination uniformity of integrating sphere, the result was shown the actual illumination uniformity was 98.8%. Finally, a visible photoelectric imaging system was tested ,and three different uniformity indicators results were given.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Deng-kui Kang, Hong Yang, Ding-guo Sha, Chang-lu Jiang, Min Chen, Xing-hui Zhong, , Shi-bang Ma, and Liang Yuan "Measurement of image plane illumination uniformity of photoelectric imaging system ", Proc. SPIE 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 92822O (18 September 2014); https://doi.org/10.1117/12.2067909
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