Research on evaluation method of CMOS camera

Shaoqiang Zhang; Weiqiang Han; Lanfang Cui

doi:10.1117/12.2070594

18 September 2014 Research on evaluation method of CMOS camera

Shaoqiang Zhang, Weiqiang Han, Lanfang Cui

Proceedings Volume 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 928238 (2014) https://doi.org/10.1117/12.2070594
Event: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2014), 2014, Harbin, China

Abstract

In some professional image application fields, we need to test some key parameters of the CMOS camera and evaluate the performance of the device. Aiming at this requirement, this paper proposes a perfect test method to evaluate the CMOS camera. Considering that the CMOS camera has a big fixed pattern noise, the method proposes the ‘photon transfer curve method’ based on pixels to measure the gain and the read noise of the camera. The advantage of this method is that it can effectively wipe out the error brought by the response nonlinearity. Then the reason of photoelectric response nonlinearity of CMOS camera is theoretically analyzed, and the calculation formula of CMOS camera response nonlinearity is deduced. Finally, we use the proposed test method to test the CMOS camera of 2560*2048 pixels. In addition, we analyze the validity and the feasibility of this method.

Citation Download Citation

Shaoqiang Zhang, Weiqiang Han, and Lanfang Cui "Research on evaluation method of CMOS camera", Proc. SPIE 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 928238 (18 September 2014); https://doi.org/10.1117/12.2070594

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