18 September 2014 Discussion on a method of target’s infrared feature extraction
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Proceedings Volume 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 92823A (2014) https://doi.org/10.1117/12.2069847
Event: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2014), 2014, Harbin, China
Abstract
Infrared characteristics of the target show some surface features of targets. By analyzing the infrared characteristics of the targets, specific properties and working condition of targets can be obtained. By studying the methods of the infrared properties of the targets, we can get a method of extracting the target surface characteristics. Actual spectral irradiance is calculated according to the dimension reduction and target’s infrared signal. Optimization model can be obtained by matching the theoretical formula of target’s irradiance with actual spectral irradiance. Equivalent temperature and equivalent area of target can be calculated by optimization methods.
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Wenxing Tian, Wenxing Tian, Qiang Li, Qiang Li, Jingneng Fu, Jingneng Fu, Lanfang Cui, Lanfang Cui, } "Discussion on a method of target’s infrared feature extraction", Proc. SPIE 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 92823A (18 September 2014); doi: 10.1117/12.2069847; https://doi.org/10.1117/12.2069847
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