Paper
21 August 2014 Multiple spectrum analysis and evaluation for optical constants of HfO2 thin films
Dandan Liu, Huasong Liu, Chenghui Jiang, Yugang Jiang, Lishuan Wang, Zhihong Zhao, Yiqin Ji
Author Affiliations +
Abstract
HfO2 thin films were deposited on ZS1 silica by Ion Beam Sputtering (IBS) technique. Optical constants of HfO2 thin films were obtained by multiple spectrum analysis method, which combined the transmittance spectrum and ellipsometry spectrum of the film. The refractive index and extinction coiefficient of HfO2 thin films were evaluated by etching experiments of the film. The analysis spectral range was between 250nm and 850nm.
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Dandan Liu, Huasong Liu, Chenghui Jiang, Yugang Jiang, Lishuan Wang, Zhihong Zhao, and Yiqin Ji "Multiple spectrum analysis and evaluation for optical constants of HfO2 thin films", Proc. SPIE 9283, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems, 92830G (21 August 2014); https://doi.org/10.1117/12.2070046
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KEYWORDS
Transmittance

Thin films

Data modeling

Refractive index

Spectrum analysis

Ellipsometry

Spectroscopic ellipsometry

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