Research on polarizing performance of Au-SiO2 sub-wavelength hybrid grating in short wave infrared (SWIR)

Wang Rui; Tao Li; Xiumei Shao; Xue Li; Haimei Gong

doi:10.1117/12.2069791

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2 September 2014 Research on polarizing performance of Au-SiO₂ sub-wavelength hybrid grating in short wave infrared (SWIR)

Wang Rui; Tao Li; Xiumei Shao; Xue Li; Haimei Gong

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Proceedings Volume 9284, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronics Materials and Devices for Sensing and Imaging; 928403 (2014) https://doi.org/10.1117/12.2069791
Event: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2014), 2014, Harbin, China

Abstract

Nanowire grating is designed within the wavelength range from 1μm to 3μm according to the sensitive wavelength of InGaAs short wave infrared (SWIR) detector. The polarization performance is analyzed on the basis of finite difference time domain (FDTD) method. In order to improve the polarization performance, we insert a SiO₂ dielectric grating between metal grating and substrate to form Au-SiO₂ hybrid grating. The numerical study shows transmittance of hybrid grating is almost 88％which is 18％ higher than monolayer metal grating at 1.8μm. In addition, the hybrid grating with the grooved- SiO₂ layer has higher transmittance efficiency than those with smooth SiO₂ layer for special wave band. By optimizing the specific parameters of the hybrid grating such as period, thickness and the groove depth of SiO₂, finally we obtain the optimal parameters of the designed hybrid grating: the grating period is 0.4 μm, the thickness and groove depth of SiO₂ are 0.4μm and 0.1μm respectively. Numerical study shows that the designed grating has advantages of wide band, high transmittance efficiency and high extinction ratio.

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Wang Rui, Tao Li, Xiumei Shao, Xue Li, and Haimei Gong "Research on polarizing performance of Au-SiO₂ sub-wavelength hybrid grating in short wave infrared (SWIR)", Proc. SPIE 9284, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronics Materials and Devices for Sensing and Imaging, 928403 (2 September 2014); https://doi.org/10.1117/12.2069791

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