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2 September 2014 An analysis of the optimal size of image sensors in free space optic systems
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Proceedings Volume 9284, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronics Materials and Devices for Sensing and Imaging; 92840R (2014) https://doi.org/10.1117/12.2067754
Event: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2014), 2014, Harbin, China
Abstract
There are several advantages offered by free space optic systems compared with conventional radio frequency systems. As a consequence of shorter wavelengths, the high directivity of the transmitted beam makes acquisition and pointing difficult, thus an imaging system is set up for acquisition and pointing. Optical wave front distortions induced by atmospheric turbulence result in a spreading of the beam leads to image jitter take place in the focal plane, where the image sensor is. The behavior of the image jitter can be described in a statistical manner. Consequently, the size, which is a very important parameter to an image sensor, can be determined by the statistical quantity of image jitter, which customarily is the root mean square (RMS) image displacement. The quantity of the RMS image displacement is as a function of several measurable parameters. In this paper, variations of the estimated RMS image displacement were calculate and discussed in detail. The calculation showed good agreement with the experimental results conducted with a propagation path length of 96 km. The optimal sizes of image sensors that are used for some specific circumstances were analyzed and proposed based on the RMS image displacement.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lixing Li, Yongmei Huang, and Tao An "An analysis of the optimal size of image sensors in free space optic systems", Proc. SPIE 9284, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronics Materials and Devices for Sensing and Imaging, 92840R (2 September 2014); https://doi.org/10.1117/12.2067754
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