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2 September 2014 The simulation and analysis of infrared target multi-band characteristics
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Proceedings Volume 9284, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronics Materials and Devices for Sensing and Imaging; 928413 (2014) https://doi.org/10.1117/12.2069212
Event: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2014), 2014, Harbin, China
Abstract
The infrared characteristic simulation of the target is the basis of true and false infrared target recognition. With the development of stealth technology, imaging features of the decoy in the detector are more and more close to the real target, so it is not easy to distinguish between the target and decoy by using information acquired from single-band infrared detector. Based on this, in the paper infrared imaging properties of the target in a number of bands are simulated and analyzed, followed by fusing the characteristic differences of multiple bands between true and false target for classification and recognition. First of all, we construct the geometrical model of target and decoy in a simple background, and then the model of infrared radiation is built. What is more, in accordance with laws of infrared radiation and other relevant laws, the characteristics of target and decoy under the condition of different bands are analyzed. Experimental results show that the proposed multi-band target simulation and analysis method can effectively identify the target and decoy in the same field of view.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lanfang Cui and Jinmei Zhou "The simulation and analysis of infrared target multi-band characteristics", Proc. SPIE 9284, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronics Materials and Devices for Sensing and Imaging, 928413 (2 September 2014); https://doi.org/10.1117/12.2069212
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