Paper
18 July 1988 Characterization Of Lanthana-Strengthened Yttria Infrared Transmitting Materials
G C Wei, C Brecher, M R Pascucci, E A Trickett, W H Rhodes
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Abstract
Lanthana-strengthened yttria is of interest for infrared applications because of its high strength, long wavel-ength cutoff (8 μm), and low emissivity. The optical, thermal, and mechanical properties of the family of La203-strengthened Y203 have been characterized. The properties can be tailored to suit the requirements of specific applications by adjusting composition and processing parameters. The La203 acts as both a densification aid during fabrication and an agent for microstructural control. Since both strength and toughness depend on microstructure, the La203 allows significant strength enhancement, an important factor for window applications. Theoretical parameters have also been calculated to aid in the assessment of relative resistance to thermal shock fracture initiation. and propagation. These calculations reveal potential inconsistencies that must be resolved by experimental testing.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
G C Wei, C Brecher, M R Pascucci, E A Trickett, and W H Rhodes "Characterization Of Lanthana-Strengthened Yttria Infrared Transmitting Materials", Proc. SPIE 0929, Infrared Optical Materials IV, (18 July 1988); https://doi.org/10.1117/12.945851
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Cited by 14 scholarly publications and 3 patents.
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KEYWORDS
Infrared radiation

Resistance

Absorption

Scattering

Infrared materials

Silica

Transmittance

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