25 November 2014 Electron microscopy studies of CNT layers
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Proceedings Volume 9290, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2014; 92901C (2014) https://doi.org/10.1117/12.2075180
Event: Symposium on Photonics Applications in Astronomy, Communications, Industry and High-Energy Physics Experiments, 2014, Warsaw, Poland
Abstract
SEM and TEM use in an investigation of CNT-Ni layers different properties is shown. We present the possibilities of using different SEM modes (SE - secondary electrons, LABE - low angle backscattered electrons) for studies of C-Ni and CNT-Ni layers topography, morphology and cross-sectional investigations (adhesion, pores size and shape, uniformity). Correlation between concentration of Ni in studied layers and technological parameters as well as in a case of CNT-Ni films correlations of Ni concentration and a diameter of carbon nanotubes are discussed. TEM studies concentrate on structure of Ni nanograins in C-Ni layers and CNT-Ni layers, CNT structure and defects, nanoonion structure. We present methods of determination of graphite plane number in MWCNTs, distance between these planes, role of catalyst position in CNT growth and interaction between catalyst and substrate. EDS method for qualitative analysis of Ni catalyst in these layers was also presented.
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Mirosław Kozłowski, Joanna Radomska, Halina Wronka, Elżbieta Czerwosz, Kamil Sobczak, "Electron microscopy studies of CNT layers", Proc. SPIE 9290, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2014, 92901C (25 November 2014); doi: 10.1117/12.2075180; https://doi.org/10.1117/12.2075180
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