17 December 2014 Tackling freeform aberrations by ray-mapping analysis
Author Affiliations +
Proceedings Volume 9293, International Optical Design Conference 2014; 92930K (2014) https://doi.org/10.1117/12.2075537
Event: International Optical Design Conference, 2014, Kohala Coast, Hawaii, United States
Abstract
We investigate the propagation of a four-dimensional ray grid through freeform optical systems. By analyzing the linear and nonlinear part of this ray-mapping at each surface we can quantify surface aberration contributions within freeform systems.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alois M. Herkommer, Alois M. Herkommer, Haiyue Yang, Haiyue Yang, } "Tackling freeform aberrations by ray-mapping analysis", Proc. SPIE 9293, International Optical Design Conference 2014, 92930K (17 December 2014); doi: 10.1117/12.2075537; https://doi.org/10.1117/12.2075537
PROCEEDINGS
5 PAGES


SHARE
RELATED CONTENT

Spectral full-field displays for spectrometers
Proceedings of SPIE (December 17 2014)
Phase space methods in HMD systems
Proceedings of SPIE (June 26 2017)
Phase space aberrations in general imaging systems
Proceedings of SPIE (June 05 2018)
Coma full-field display for freeform imaging systems
Proceedings of SPIE (October 11 2015)
Calculation of polychromatic aberration coefficients
Proceedings of SPIE (October 14 2005)

Back to Top