3 December 2014 Optimized dithering technique for 3D shape measurement based on intensity residual error
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Proceedings Volume 9297, International Symposium on Optoelectronic Technology and Application 2014: Laser and Optical Measurement Technology; and Fiber Optic Sensors; 92970Z (2014); doi: 10.1117/12.2071895
Event: International Symposium on Optoelectronic Technology and Application 2014, 2014, Beijing, China
Abstract
It is obvious that those recently developed dithering techniques could improve measurement quality. However, those optimization methods are still imperfect since they are sensitive to the amount of defocusing. This paper presents a new optimization method based on minimizing a proposed objective function named intensity residual error (IRE) to construct binary patterns for high-quality 3D shape measurement. Both the simulation and experimental results demonstrate that the proposed algorithm can achieve phase quality improvements over other developed dithering techniques with various amounts of defocusing especially when the fringe period is larger.
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Jiasong Sun, Yuzhen Zhang, Chao Zuo, Shijie Feng, ShiLing Yu, Qian Chen, "Optimized dithering technique for 3D shape measurement based on intensity residual error", Proc. SPIE 9297, International Symposium on Optoelectronic Technology and Application 2014: Laser and Optical Measurement Technology; and Fiber Optic Sensors, 92970Z (3 December 2014); doi: 10.1117/12.2071895; https://doi.org/10.1117/12.2071895
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