The error analyze of testing the large aperture flat by the Ritchey-Common method

Bo Ji; Chen Xu; Bo Li

doi:10.1117/12.2071403

18 November 2014 The error analyze of testing the large aperture flat by the Ritchey-Common method

Bo Ji, Chen Xu, Bo Li

Author Affiliations +

Proceedings Volume 9298, International Symposium on Optoelectronic Technology and Application 2014: Imaging Spectroscopy; and Telescopes and Large Optics; 92981A (2014) https://doi.org/10.1117/12.2071403
Event: International Symposium on Optoelectronic Technology and Application 2014, 2014, Beijing, China

Abstract

When polishing and modifying the large aperture flat by the traditional polishing tools, people usually test it by a spherical mirror as a standard surface which been called the Ritchey-Common method, that not only can break through the limitation of the aperture, but also can achieve high precision wave front if the surface of the standard mirror is perfect. However, when doing ultrahigh precision modifying by the modern polishing equipment such as: ion beam polishing, this testing method cannot meet the need of the high precision location, because of the error caused by the nonlinear transformation of the coordinate, the testing result usually cannot been very exactly developed point to point, that restrained the polishing accuracy. Here the error has been studied in order to exactly developing the testing result. At first, in principle, the Ritchey- Common testing path has been analyzed in detail. Secondly, the point to point transfer equation has been deduced, and some feature points have been chosen to help analyze the relationship between the object surface and the image result. Then a program has been written according to the deduced equation, by which the image can be well developed. Finally the error has been compared by using different developing methods in the experiment. The study can solve the nonlinear point to point transfer and location problem caused by the Ritchey-Common testing method, so when manufacturing the large aperture flat, the Ritchey-Common testing method can be used in the ultrahigh precision polishing.

Citation Download Citation

Bo Ji, Chen Xu, and Bo Li "The error analyze of testing the large aperture flat by the Ritchey-Common method", Proc. SPIE 9298, International Symposium on Optoelectronic Technology and Application 2014: Imaging Spectroscopy; and Telescopes and Large Optics, 92981A (18 November 2014); https://doi.org/10.1117/12.2071403

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

;

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE