4 March 2015 Review of recent developments of spatial phase-shift digital shearography
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Proceedings Volume 9302, International Conference on Experimental Mechanics 2014; 93020E (2015) https://doi.org/10.1117/12.2075536
Event: International Conference on Experimental Mechanics 2014, 2014, Singapore, Singapore
Abstract
In the last decade, due to the fast development of phase-shift technique, the measurement sensitivity of digital shearography (DS) technology has been increased tens of times which brings the technology itself a wide acceptance by the industry as a practical measurement tool for quality inspection and non-destructive testing. In common sense, compare to Temporal Phase-Shift Digital Shearography (TPS-DS), Spatial Phase-Shift Digital Shearograhy (SPS-DS) has the advantage of a broader capability for both static and dynamic measurement applications while keeps the disadvantage of lower phase-map quality. Recently, with new developments, the phase map quality of spatial phase-shift digital shearography has been greatly improved which is now comparable to the temporal phase-shift technique. This article gives a review of recent developments of spatial phase-shift digital shearography. Theory, experimental setup, phase-map results and applications are shown in detail.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xin Xie, Xiaona Li, Xu Chen, Lianxiang Yang, "Review of recent developments of spatial phase-shift digital shearography", Proc. SPIE 9302, International Conference on Experimental Mechanics 2014, 93020E (4 March 2015); doi: 10.1117/12.2075536; https://doi.org/10.1117/12.2075536
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