4 March 2015 Temperature aspect of degradation of electrochemical double-layer capacitors (EDLC)
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Proceedings Volume 9302, International Conference on Experimental Mechanics 2014; 930217 (2015) https://doi.org/10.1117/12.2080945
Event: International Conference on Experimental Mechanics 2014, 2014, Singapore, Singapore
Abstract
Electric double layer capacitors (EDLC) cells have a process variation and temperature dependency in capacitance so that balancing is required when they are connected in series, which includes electronic voltage management based on capacitance monitoring. This paper measured temperature aspect of capacitance periodically to monitor health and degradation behavior of EDLC stressed under high temperatures and zero below temperatures respectively, which enables estimation of the state of health (SOH) regardless of temperature. At high temperature, capacitance saturation and delayed expression of degradation was observed. After cyclic stress at zero below temperature, less effective degradation and time recovery phenomenon were occurred.
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Dong-Cheon Baek, Hyun-Ho Kim, Soon-Bok Lee, "Temperature aspect of degradation of electrochemical double-layer capacitors (EDLC)", Proc. SPIE 9302, International Conference on Experimental Mechanics 2014, 930217 (4 March 2015); doi: 10.1117/12.2080945; https://doi.org/10.1117/12.2080945
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