4 March 2015 A new phase error compensation method in digital holographic microscopy
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Proceedings Volume 9302, International Conference on Experimental Mechanics 2014; 93023M (2015) https://doi.org/10.1117/12.2076855
Event: International Conference on Experimental Mechanics 2014, 2014, Singapore, Singapore
Abstract
In this paper we present a new method to compensate for phase aberrations and image distortion with recording single digital hologram in digital holographic microscopy. In our method, tilt is removed from the abberrated phase map first. Then an area of interest (AOI) is generated by flood filled algorithm. By fitting AOI with discrete orthogonal Zernike polynomials, error phase map in the form of a series of Zernike polynomials is obtained. Final result can be calculated by subtracting the error phase map from the abberrated phase map. Through applying our method in microlens testing, phase aberrations and image distortion introduced by microscope objective are well suppressed.
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Zhaomin Wang, Zhaomin Wang, Weijuan Qu, Weijuan Qu, Yongfu Wen, Yongfu Wen, Fang Yang, Fang Yang, Anand Asundi, Anand Asundi, } "A new phase error compensation method in digital holographic microscopy", Proc. SPIE 9302, International Conference on Experimental Mechanics 2014, 93023M (4 March 2015); doi: 10.1117/12.2076855; https://doi.org/10.1117/12.2076855
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