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10 March 2015 Improving resolution of optical coherence tomography for imaging of microstructures
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Abstract
Multi-frame superresolution technique has been used to improve the lateral resolution of spectral domain optical coherence tomography (SD-OCT) for imaging of 3D microstructures. By adjusting the voltages applied to π‘₯ and 𝑦 galvanometer scanners in the measurement arm, small lateral imaging positional shifts have been introduced among different C-scans. Utilizing the extracted π‘₯-𝑦 plane en face image frames from these specially offset C-scan image sets at the same axial position, we have reconstructed the lateral high resolution image by the efficient multi-frame superresolution technique. To further improve the image quality, we applied the latest K-SVD and bilateral total variation denoising algorithms to the raw SD-OCT lateral images before and along with the superresolution processing, respectively. The performance of the SD-OCT of improved lateral resolution is demonstrated by 3D imaging a microstructure fabricated by photolithography and a double-layer microfluidic device.
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Kai Shen, Hui Lu, James H. Wang, and Michael R. Wang "Improving resolution of optical coherence tomography for imaging of microstructures", Proc. SPIE 9334, Optical Methods in Developmental Biology III, 93340X (10 March 2015); https://doi.org/10.1117/12.2080415
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