26 February 2015 Characterization of far field of diode laser by three dimensional measurement
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In this paper three dimensional characterization of the far field of diode laser beam is proposed. Both the divergence angle and intensity distribution can be extracted and analyzed from the measurement results with obliquity factor correction and power transmission correction. The instrument provides high resolution and fast measurement.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hui Liu, Hui Liu, Zhiyuan Yuan, Zhiyuan Yuan, Long Cui, Long Cui, Di Wu, Di Wu, Xingsheng Liu, Xingsheng Liu, "Characterization of far field of diode laser by three dimensional measurement", Proc. SPIE 9346, Components and Packaging for Laser Systems, 93461A (26 February 2015); doi: 10.1117/12.2076548; https://doi.org/10.1117/12.2076548


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