13 March 2015 Thermal signature identification system (TheSIS): a spread spectrum temperature cycling method
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Proceedings Volume 9369, Photonic Instrumentation Engineering II; 93690M (2015) https://doi.org/10.1117/12.2080159
Event: SPIE OPTO, 2015, San Francisco, California, United States
Abstract
NASA GSFC’s Thermal Signature Identification System (TheSIS) 1) measures the high order dynamic responses of optoelectronic components to direct sequence spread-spectrum temperature cycling, 2) estimates the parameters of multiple autoregressive moving average (ARMA) or other models the of the responses, 3) and selects the most appropriate model using the Akaike Information Criterion (AIC). Using the AIC-tested model and parameter vectors from TheSIS, one can 1) select high-performing components on a multivariate basis, i.e., with multivariate Figures of Merit (FOMs), 2) detect subtle reversible shifts in performance, and 3) investigate irreversible changes in component or subsystem performance, e.g. aging. We show examples of the TheSIS methodology for passive and active components and systems, e.g. fiber Bragg gratings (FBGs) and DFB lasers with coupled temperature control loops, respectively.
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Scott Merritt, "Thermal signature identification system (TheSIS): a spread spectrum temperature cycling method", Proc. SPIE 9369, Photonic Instrumentation Engineering II, 93690M (13 March 2015); doi: 10.1117/12.2080159; https://doi.org/10.1117/12.2080159
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