23 April 2015 Front Matter: Volume 9378
This PDF file contains the front matter associated with SPIE Proceedings Volume 9378 including the Title Page, Copyright information, Table of Contents, Introduction, and Conference Committee listing.

The papers included in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. The papers published in these proceedings reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

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Author(s), “Title of Paper,” in Slow Light, Fast Light, and Opto-Atomic Precision Metrology VIII, edited by Selim M. Shahriar, Jacob Scheuer, Proceedings of SPIE Vol. 9378 (SPIE, Bellingham, WA, 2015) Article CID Number.

ISSN: 0277-786X

ISBN: 9781628414684

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  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript. The complete citation is used on the first page, and an abbreviated version on subsequent pages.


Numbers in the index correspond to the last two digits of the six-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first four digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B...0Z, followed by 10-1Z, 20-2Z, etc.

Amy-Klein, Anne, 23

Arora, Arushi, 0E

Bercy, Anthony, 23

Bernier, Martin, 0E

Bi, Zhuanfang, 1Q

Black, Jennifer A., 03

Bortolozzo, U., 1S, 1T

Boyd, Robert W., 0D

Burke, John H., 1Z

Cavalieri, Stefano, 0H

Chardonnet, Christian, 23

Chen, Jiayang, 1Q

Chiodo, Nicola, 23

Clark, Jeremy B., 0T

Davidson, Nir, 1B

Dhayal, Suman, 1C

Digonnet, Michel J. F., 0E, 1P

Dolfi, D., 1S, 1T

Eger, David, 1B

Fallon, A., 1Y

Fini, Lorenzo, 0H

Firstenberg, Ofer, 1B

Franke-Arnold, Sonja, 0D

Gibson, Graham, 0D

Giraud-Carrier, Matthieu, 03

Glasser, Ryan T., 0T

Glorieux, Quentin, 0T

Hawkins, Aaron R., 03

Huang, Anping, 1Q

Huignard, J. P., 1S, 1T

Ignesti, Emilio, 0H

Jin, Junjie, 1Q

Jones, Kevin M., 0T

Khripunov, Sergey, 0A

Kobtsev, Sergey, 0A

Kotlicki, Omer, 0G

Kumar, Ranjeet, 0R

Leonard, R. H., 1Y

Lett, Paul D., 0T

Li, Tian, 0T

Lin, Jian, 1Q

Liu, Jinmei, 0J

Lopez, Olivier, 23

Molin, S., 1S, 1T

Mookherjea, Shayan, 0R

Narum, Paul, 0D

Padgett, Miles J., 0D

Peigné, A., 1S, 1T

Pottie, Paul-Eric, 23

Qin, Minglei, 0J

Quintin, Nicolas, 23

Radnatarov, Daba, 0A

Residori, S., 1S, 1T

Rostovtsev, Yuri V., 1C

Sackett, C. A., 1Y

Santarelli, Giorgio, 23

Savanier, Marc, 0R

Scheuer, Jacob, 0G, 0O

Schmidt, Holger, 03

Schneider, Thomas, 22

Shahriar, Selim, 0O

Shi, Zhimin, 0D

Skolianos, George, 0E

Smartsev, Slava, 1B

Stefani, Fabio, 23

Tommasi, Federico, 0H

Vigneron, Pierre-Baptiste, 1P

Vogl, Ulrich, 0T

Wang, Tantan, 0J

Wiotte, Fabrice, 23

Wisniewski-Barker, Emma, 0D

Xiao, Zhisong, 1Q

Zamani Aghaie, Kiarash, 1P

Zhan, Li, 0J

Zhang, Hao, 1Q

Zhang, Liang, 0J

Zhao, Long, 1Q

Conference Committee

Symposium Chairs

  • David L. Andrews, University of East Anglia (United Kingdom)

  • Alexei L. Glebov, OptiGrate Corporation (United States)

Symposium Co-chairs

  • Jean-Emmanuel Broquin, IMEP-LAHC (France)

  • Shibin Jiang, AdValue Photonics, Inc. (United States)

Program Track Chair

  • Zameer U. Hasan, Temple University (United States)

Conference Chairs

  • Selim M. Shahriar, Northwestern University (United States)

  • Jacob Scheuer, Tel Aviv University (Israel)

Conference Program Committee

  • Tony Abi-Salloum, Widener University (United States)

  • Shanhui Fan, Stanford University (United States)

  • Daniel Joseph Gauthier, Duke University (United States)

  • Kohzo Hakuta, The University of Electro-Communications (Japan)

  • Ortwin Hess, Imperial College London (United Kingdom)

  • John C. Howell, University of Rochester (United States)

  • Jacob B. Khurgin, Johns Hopkins University (United States)

  • Uriel Levy, The Hebrew University of Jerusalem (Israel)

  • Frank A. Narducci, Naval Air Systems Command (United States)

  • Irina Novikova, The College of William & Mary (United States)

  • Gour S. Pati, Delaware State University (United States)

  • Stefania Residori, Institut Non Lineaire de Nice Sophia Antipolis (France)

  • Yuri Rostovtsev, University of North Texas (United States)

  • David D. Smith, NASA Marshall Space Flight Center (United States)

  • Yanhong Xiao, Fudan University (China)

Session Chairs

  • 1 Slow Light: Waveguides and Resonators

    Gour S. Pati, Delaware State University (United States)

  • 2 Precision Metrology: CPT-based Clocks and Cooled Molecular Ions

    Yannick Dumeige, Ecole Nationale Superieure des Sciences Appliquées et de Technologie (France)

  • 3 Slow Light: Optimization and Application of Delay

    Jacob Scheuer, Tel Aviv University (Israel)

  • 4 Fast Light: Generation, Application, and Comparison with Slow Light

    David D. Smith, NASA Marshall Space Flight Center (United States)

  • 5 Precision Metrology Using Fast Light: Gyroscopy and Gravitational Wave Detection

    Robert W. Boyd, University of Ottawa (Canada)

  • 6 Slow Light: Quantum Information

    Eugeniy E. Mikhailov, The College of William & Mary (United States)

  • 7 Precision Metrology: Spin Squeezing, Optical Squeezing, and Photon Correlation Interferometry

    Elizabeth Donley, National Institute of Standards and Technology (United States)

  • 8 Slow Light: Non-Linear Optics and Photon Drag

    John C. Howell, University of Rochester (United States)

  • 9 Precision Metrology: Sensing with NV Diamond Color Centers

    Yanhong Xiao, Fudan University (China)

  • 10 Slow Light: Novel Effects and New Directions

    Susanne F. Yelin, University of Connecticut (United States)

  • 11 Slow Light: New Platforms and Systems

    Jacob B. Khurgin, Johns Hopkins University (United States)

  • 12 Slow Light: Plasmonics and Metamaterials

    Jesper Moerk, Technical University of Denmark (Denmark)

  • 13 Precision Metrology: Coupled Resonator Gyroscopes and Other Sensors

    Uriel Levy, The Hebrew University of Jerusalem (Israel)

  • 14 Precision Metrology: Atomic Interferometry

    Selim M. Shahriar, Northwestern University (United States)

  • 15 Precision Metrology: Optical Clock and Frequency Combs

    Charles Sackett, University of Virginia (United States)

  • 16 Precision Metrology: Matter Wave Clock, Collective State Clock, and Other Developments

    John H. Burke, Air Force Research Laboratory (United States)

© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
} "Front Matter: Volume 9378", Proc. SPIE 9378, Slow Light, Fast Light, and Opto-Atomic Precision Metrology VIII, 937801 (23 April 2015); doi: 10.1117/12.2192721; https://doi.org/10.1117/12.2192721

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