Automated determination of volume phase hologram parameters

Robert D. Brown; James H. Stanley

doi:10.1117/12.2077841

10 March 2015 Automated determination of volume phase hologram parameters

Robert D. Brown, James H. Stanley

Proceedings Volume 9386, Practical Holography XXIX: Materials and Applications; 93860I (2015) https://doi.org/10.1117/12.2077841
Event: SPIE OPTO, 2015, San Francisco, California, United States

Abstract

Commercially available ray tracing programs by themselves are not adequate for modelling optical systems with holographic gratings. In this paper, we describe a suite of tools that we have developed specifically for working with volume phase holograms. One tool measures the diffraction efficiency of a grating with respect to angle and position. Our automated measurement process is described. The measured diffraction data is analyzed to extract key grating parameters; such as, grating thickness and index modulation. The theoretical basis for this analysis is described. The extracted grating parameters can be used to ray trace expected performance for comparison with direct measurements. Such a methodology has allowed us to develop modelling capabilities that can be confidently used to compare design options and guide development activities. In our environment, data is collected and grating parameters are extracted using LabView; ray tracing is performed using Zemax. The concepts, however, are quite general. An example of measuring a grating recorded in a photopolymer and extracting its grating parameters is given. Results are compared to published datasheet specifications.

Citation Download Citation

Robert D. Brown and James H. Stanley "Automated determination of volume phase hologram parameters", Proc. SPIE 9386, Practical Holography XXIX: Materials and Applications, 93860I (10 March 2015); https://doi.org/10.1117/12.2077841

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