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13 March 2015 New generation of Fourier optics instruments for fast multispectral BRDF characterization
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Proceedings Volume 9398, Measuring, Modeling, and Reproducing Material Appearance 2015; 93980H (2015) https://doi.org/10.1117/12.2077600
Event: SPIE/IS&T Electronic Imaging, 2015, San Francisco, California, United States
Abstract
A new generation of Fourier optics multispectral instruments that allow rapid full diffused or collimated beam spectral BRDF measurements is presented. Light detection is made simultaneously at all angular locations including the illumination direction. Backscattering effect in the fields of cosmetics and parasitic reflection of mobile displays are reported as examples.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Pierre Boher, Thierry Leroux, Véronique Collomb-Patton, and Thibault Bignon "New generation of Fourier optics instruments for fast multispectral BRDF characterization", Proc. SPIE 9398, Measuring, Modeling, and Reproducing Material Appearance 2015, 93980H (13 March 2015); https://doi.org/10.1117/12.2077600
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