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13 March 2015 An image-based multi-directional reflectance measurement setup for flexible objects
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Proceedings Volume 9398, Measuring, Modeling, and Reproducing Material Appearance 2015; 93980J (2015)
Event: SPIE/IS&T Electronic Imaging, 2015, San Francisco, California, United States
This paper presents an image-based method to measure reflectance of a homogeneous flexible object material (usually used in packaging). A point light source and a commercially available RGB camera is used to illuminate and measure the radiance reflected from the object surface in multiple reflection directions. By curving the flexible object onto a cylinder of known radius we are able to record radiance at multiple reflection angles in a faster way. In order to estimate the reflectance and to characterise the material, a spectralon reference tile is used. The spectralon tile is assumed to be homogenous and has near lambertain surface properties. Using Lambert’s cosine law, irradiance at a given point on the object surface is calculated. This information is then used to calculate a BRDF using Phong reflection model to describe the sample surface reflection properties. The measurement setup is described and discussed in this paper along with its use to estimate a BRDF for a given material/substrate. Results obtained indicate that the proposed image-based technique works well to measure light reflected at different planar angles and record information to estimate the BRDF of the sample materials that can be modelled using Phong reflection model. The object material properties, sample curvature and camera resolution decides the number of incident and reflection angles at which the bi-directional reflectance, or the material BRDF, can be estimated using this method.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Aditya S. Sole, Ivar Farup, and Shoji Tominaga "An image-based multi-directional reflectance measurement setup for flexible objects", Proc. SPIE 9398, Measuring, Modeling, and Reproducing Material Appearance 2015, 93980J (13 March 2015);


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