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1 April 2015 Front Matter: Volume 9403
Proceedings Volume 9403, Image Sensors and Imaging Systems 2015; 940301 (2015)
Event: SPIE/IS&T Electronic Imaging, 2015, San Francisco, California, United States
This PDF file contains the front matter associated with SPIE Proceedings Volume 9403 including the Title Page, Copyright information, Table of Contents, Introduction, and Conference Committee listing.

The papers included in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. The papers published in these proceedings reflect the work and thoughts of the authors and are published herein as submitted. The publishers are not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from this book:

Author(s), “Title of Paper,” in Image Sensors and Imaging Systems 2015, edited by Ralf Widenhorn, Antoine Dupret, Proceedings of SPIE-IS&T Electronic Imaging, SPIE Vol. 9403, Article CID Number (2015)

ISSN: 0277-786X

ISBN: 9781628414936

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Paper Numbering: Proceedings of SPIE follow an e-First publication model, with papers published first online and then in print. Papers are published as they are submitted and meet publication criteria. A unique citation identifier (CID) number is assigned to each article at the time of the first publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online, print, and electronic versions of the publication. SPIE uses a six-digit CID article numbering system in which:

  • The first four digits correspond to the SPIE volume number.

  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc.

The CID Number appears on each page of the manuscript. The complete citation is used on the first page, and an abbreviated version on subsequent pages.


Numbers in the index correspond to the last two digits of the six-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first four digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B...0Z, followed by 10-1Z, 20-2Z, etc.

Ahn, Peter, 0M

Alanazi, Mohammed S., 0S

Aldosary, Abdullah F., 0S

Alghamdi, Abdulrahman S., 0S

Asami, T., 02

Bae, Myunghan, 0O

Barjean, K., 08

Bonifazi, Giuseppe, 0R

Bonnard, R., 04

Callet, Patrick, 0B

Carmona-Galán, R., 0I

Chang, Yuchun, 05, 0K, 0L

Chapman, Glenn H., 0T

Charlet, Alexandre, 0P

Cho, KwangJun, 0M

Choi, Byoung-Soo, 0O

Choi, EunJung, 0M

Choi, Pyung, 0O

Contreras, K., 08

Deegan, Brian M., 0F

Denny, Patrick E., 0F

Dever, Barry, 0F

Dias, Morgado, 06

Ding, Ning, 0L

Domínguez-Castro, Rafael, 0P

Dubois, Jérôme, 0J

Dunne, Bruce E., 0N

Eda, K., 02

Egawa, Y., 02

Ettori, D., 08

Fuchs, Philippe, 0B

González-Márquez, Ana, 0P

Gou, JaSeung, 0M

Guellec, F., 04

Hasumi, R., 02

Honda, K., 02

Jiao, Lihong, 0N

Jiménez-Garrido, Francisco, 0P

Jo, Sung-Hyun, 0O

Kagawa, Keiichiro, 0C

Kawahito, Shoji, 0C

Koren, Israel, 0T

Koren, Zahava, 0T

Kuroda, R., 0E

Kusuhara, F., 0E

Laudereau, J.-B., 08

Li, Jing, 05

Li, Zhaohan, 0K

Liu, Tianzhao, 0L

Liu, Yang, 05

Ma, Cheng, 05, 0K, 0L

Maghrabi, A. H., 0S

Medeiro, Fernando, 0P

Mochizuki, A., 02

Momose, H. S., 02

Muller, Thomas, 0B

Musa, Purnawarman, 0J

Ninkov, Zoran, 0A

Ohguro, T., 02

Ootani, H., 02

Paindavoine, Michel, 0J

Palmieri, Roberta, 0R

Park, HyunMook, 0M

Peng, Can, 0L

Peng, Leli, 0K

Porral, Philippe, 0B

Ramaz, F., 08

Rodríguez-Vázquez, Angel, 0I, 0P

Russell, Laura, 0F

Sandré-Chardonnal, Etienne, 0B

Santos, Pedro, 06

Sasaki, H., 02

Segura Puchades, J., 04

Seo, KangBong, 0M

Seo, Min-Woong, 0C

Serranti, Silvia, 0R

Sešek, Aleksander, 03

Shin, Jang-Kyoo, 0O

Sousa, Ricardo M., 06

Sugawa, S., 0E

Sugiura, Y., 02

Švigelj, Andrej, 03

Takasawa, Taishi, 0C

Taylor, Steven, 0N

Thomas, Rahul, 0T

Thomas, Rohit, 0T

Tinet, E., 08

Toyoshima, Y., 02

Trontelj, Janez, 03

Tsagkatakis, Grigorios, 07

Tsakalides, Panagiotis, 07

Tualle, J.-M., 08

Uhring, Pr. W., 04

Um, JiYong, 0M

Villegas, Alberto, 0P

Vornicu, I., 0I

Vorobiev, Dmitry, 0A

Wakashima, S., 0E

Wang, Gengyun, 0K, 0L

Wang, Xinyang, 05

Wäny, Martin, 06

Yamashita, H., 02

Yasutomi, Keita, 0C

Yoo, SangDong, 0M

Zhang, Bo, 0C

Zhou, Quan, 05

Zlokolica, Vladimir, 0F

Conference Committee

Symposium Chair

  • Sheila S. Hemami, Northeastern University (United States)

Symposium Co-chair

  • Choon-Woo Kim, Inha University (Korea, Republic of)

Conference Chairs

  • Ralf Widenhorn, Portland State University (United States)

  • Antoine Dupret, Commissariat à l’Énergie Atomique (France)

Conference Program Committee

  • Morley M. Blouke, Portland State University (United States)

    Erik Bodegom, Portland State University (United States)

    Calvin Chao, Taiwan Semiconductor Manufacturing Company Ltd. (Taiwan)

    Glenn H. Chapman, Simon Fraser University (Canada)

    Arnaud Darmont, Aphesa SPRL (Belgium)

    James A. DiBella Sr., Truesense Imaging, Inc. (United States)

    Boyd A. Fowler, BAE Systems (United States)

    Bumsuk Kim, Samsung Electronics Company, Ltd. (Korea, Republic of)

    Rihito Kuroda, Tohoku University (Japan)

    Kevin J. Matherson, Microsoft Corporation (United States)

    Alice L. Reinheimer, e2v Aerospace and Defense, Inc. (United States)

    Nobukazu Teranishi, University of Hyogo (Japan)

    Jean-Michel Tualle, Université Paris 13 (France)

    Gordon Wan, Google (United States)

    Xinyang Wang, Chinese Academy of Sciences (China)

Session Chairs

  • 1 High-Performance Sensors

    Xinyang Wang, Chinese Academy of Sciences (China)

  • 2 Sensors, Color, and Spectroscopy

    Ralf Widenhorn, Portland State University (United States)

  • 3 Sensor Performance and Modeling

    Jean-Michel Tualle, Université Paris 13 (France)

  • 4 Smart Sensors

    Antoine Dupret, Commissariat à l’Énergie Atomique (France)

  • 5 Noise

    Rihito Kuroda, Tohoku University (Japan)

    Alice L. Reinheimer, e2v Aerospace and Defense, Inc. (United States)

© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 9403", Proc. SPIE 9403, Image Sensors and Imaging Systems 2015, 940301 (1 April 2015);

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