19 March 2015 Metrology of DSA process using TEM tomography
Author Affiliations +
Directed self-assembly (DSA) of block copolymers (BCPs) is a rising technique for sub-20 nm patterning. To fully harness DSA capabilities for patterning, a detailed understanding of the three dimensional (3D) structure of BCPs is needed. By combining sequential infiltration synthesis (SIS) and scanning transmission electron microscopy (STEM) tomography, we have characterized the 3D structure of self-assembled and DSA BCPs films with high precision and resolution. SIS is an emerging technique for enhancing pattern transfer in BCPs through the selective growth of inorganic material in polar BCP domains. Here, Al2O3 SIS was used to enhance the imaging contrast and enable tomographic characterization of BCPs with high fidelity. Moreover, by utilizing SIS for both 3D characterization and hard mask fabrication, we were able to characterize the BCP morphology as well as the alumina nanostructures that would be used for pattern transfer.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tamar Segal-Peretz, Tamar Segal-Peretz, Jonathan Winterstein, Jonathan Winterstein, Jiaxing Ren, Jiaxing Ren, Mahua Biswas, Mahua Biswas, J. Alexander Liddle, J. Alexander Liddle, Jeffery W. Elam, Jeffery W. Elam, Leonidas E. Ocola, Leonidas E. Ocola, Ralu N. S. Divan, Ralu N. S. Divan, Nestor Zaluzec, Nestor Zaluzec, Paul F. Nealey, Paul F. Nealey, "Metrology of DSA process using TEM tomography", Proc. SPIE 9424, Metrology, Inspection, and Process Control for Microlithography XXIX, 94240U (19 March 2015); doi: 10.1117/12.2085577; https://doi.org/10.1117/12.2085577

Back to Top