PROCEEDINGS VOLUME 9440
THE INTERNATIONAL CONFERENCE ON MICRO- AND NANO-ELECTRONICS 2014 | 6-10 OCTOBER 2014
International Conference on Micro- and Nano-Electronics 2014
THE INTERNATIONAL CONFERENCE ON MICRO- AND NANO-ELECTRONICS 2014
6-10 October 2014
Zvenigorod, Russian Federation
Front Matter: Volume 9440
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 944001 (22 December 2014); doi: 10.1117/12.2184083
Micro- and Nanoelectronic Materials and Films I
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 944002 (18 December 2014); doi: 10.1117/12.2181010
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 944003 (18 December 2014); doi: 10.1117/12.2180429
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 944004 (18 December 2014); doi: 10.1117/12.2181009
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 944005 (18 December 2014); doi: 10.1117/12.2181906
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 944006 (18 December 2014); doi: 10.1117/12.2180999
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 944007 (18 December 2014); doi: 10.1117/12.2179474
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 944008 (18 December 2014); doi: 10.1117/12.2180763
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 944009 (18 December 2014); doi: 10.1117/12.2180901
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94400A (18 December 2014); doi: 10.1117/12.2180420
Micro- and Nanoelectronic Materials and Films II
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94400B (18 December 2014); doi: 10.1117/12.2180958
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94400C (18 December 2014); doi: 10.1117/12.2180937
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94400D (18 December 2014); doi: 10.1117/12.2179765
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94400E (18 December 2014); doi: 10.1117/12.2180775
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94400F (18 December 2014); doi: 10.1117/12.2179349
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94400G (18 December 2014); doi: 10.1117/12.2179347
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94400H (18 December 2014); doi: 10.1117/12.2180871
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94400I (18 December 2014); doi: 10.1117/12.2180700
Micro- and Nanoelectronic Technologies and Equipment
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94400J (18 December 2014); doi: 10.1117/12.2179993
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94400K (18 December 2014); doi: 10.1117/12.2180434
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94400L (18 December 2014); doi: 10.1117/12.2181006
Diagnostics and Metrology
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94400M (18 December 2014); doi: 10.1117/12.2181199
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94400N (18 December 2014); doi: 10.1117/12.2181191
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94400O (18 December 2014); doi: 10.1117/12.2179243
Physics and Technology of Micro- and Nanodevices
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94400P (18 December 2014); doi: 10.1117/12.2181137
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94400R (18 December 2014); doi: 10.1117/12.2180885
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94400S (18 December 2014); doi: 10.1117/12.2180637
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94400T (18 December 2014); doi: 10.1117/12.2180681
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94400U (18 December 2014); doi: 10.1117/12.2180876
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94400V (18 December 2014); doi: 10.1117/12.2180464
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94400W (18 December 2014); doi: 10.1117/12.2179558
Modeling and Simulation I
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94400X (18 December 2014); doi: 10.1117/12.2180809
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94400Y (18 December 2014); doi: 10.1117/12.2181068
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94400Z (18 December 2014); doi: 10.1117/12.2179218
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 944010 (18 December 2014); doi: 10.1117/12.2180533
Modeling and Simulation II
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 944011 (18 December 2014); doi: 10.1117/12.2180607
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 944012 (18 December 2014); doi: 10.1117/12.2179602
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 944013 (18 December 2014); doi: 10.1117/12.2180417
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 944014 (18 December 2014); doi: 10.1117/12.2180082
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 944015 (18 December 2014); doi: 10.1117/12.2180437
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 944016 (18 December 2014); doi: 10.1117/12.2180615
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 944017 (18 December 2014); doi: 10.1117/12.2180112
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 944018 (18 December 2014); doi: 10.1117/12.2179168
Modeling and Simulation III
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 944019 (18 December 2014); doi: 10.1117/12.2180610
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94401A (18 December 2014); doi: 10.1117/12.2180608
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94401B (18 December 2014); doi: 10.1117/12.2180756
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94401C (18 December 2014); doi: 10.1117/12.2180758
Quantum Informatics
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94401D (18 December 2014); doi: 10.1117/12.2181023
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94401E (18 December 2014); doi: 10.1117/12.2180727
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94401F (18 December 2014); doi: 10.1117/12.2180733
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94401G (18 December 2014); doi: 10.1117/12.2180330
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94401H (18 December 2014); doi: 10.1117/12.2180961
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94401I (18 December 2014); doi: 10.1117/12.2180954
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94401J (18 December 2014); doi: 10.1117/12.2181076
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94401K (18 December 2014); doi: 10.1117/12.2181090
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94401L (18 December 2014); doi: 10.1117/12.2180949
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94401M (18 December 2014); doi: 10.1117/12.2180736
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94401N (18 December 2014); doi: 10.1117/12.2180581
Back to Top