18 December 2014 The sensor of surface defects based on electrical impedance tomography technique
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Proceedings Volume 9440, International Conference on Micro- and Nano-Electronics 2014; 94400V (2014) https://doi.org/10.1117/12.2180464
Event: The International Conference on Micro- and Nano-Electronics 2014, 2014, Zvenigorod, Russian Federation
Abstract
This paper describes the application of electrical impedance tomography (EIT) to development of the surface defect sensor that can be used for structural health monitoring (such structural as bridge bearing, airframe, etc.). Thin conductive film with electrodes along its boundaries, as a sensor skin, is applied to structural surface. By using the corresponding boundary potential measurements and the value of applied current the both forward and inverse EIT problem were solved and method of defects detection in thin conductive film was created. This method allows calculating two-dimensional distribution of conductivity in film (conductivity map) and, indirectly, distribution of defects in it. The reconstruction defect efficiency criterion and the method of its calculation were proposed. The influence of initial data disturbance (non-uniform conductivity of the film as its roughness) on reconstruction defect efficiency without using all the combinations of current electrodes was examined.
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Eugeny A. Ryndin, Eugeny A. Ryndin, Alina S. Isaeva, Alina S. Isaeva, } "The sensor of surface defects based on electrical impedance tomography technique", Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 94400V (18 December 2014); doi: 10.1117/12.2180464; https://doi.org/10.1117/12.2180464
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