6 March 2015 Application of harmonic analysis method based on two-dimensional Fourier transform to flatness error sampling
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Proceedings Volume 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation; 94460A (2015) https://doi.org/10.1117/12.2084029
Event: International Symposium on Precision Engineering Measurement and Instrumentation, 2014, Changsha/Zhangjiajie, China
Abstract
The flatness errors of several different parts were sampled from a Coordinate Measuring Machine and then the harmonic characteristics of flatness errors were analyzed by observing the three-dimensional frequency spectrum obtained by calculating the data through Two-Dimensional Fast Fourier Transform. It was found through experiment and analysis that each harmonic component of a flatness error is generally similar if the processing system is reliable, i.e. the highest harmonic wavelength of a random error is infinite, and Nyquist Sampling Theorem can not be applied to directly verify flatness error sampling points.
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Yu Wang, Yu Wang, Xingwang Li, Xingwang Li, Dongdong Ma, Dongdong Ma, Fugui Huang, Fugui Huang, } "Application of harmonic analysis method based on two-dimensional Fourier transform to flatness error sampling", Proc. SPIE 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation, 94460A (6 March 2015); doi: 10.1117/12.2084029; https://doi.org/10.1117/12.2084029
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