6 March 2015 Surface profile measurement of microstructures with steep slopes by sample-titling strategy
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Proceedings Volume 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation; 944623 (2015) https://doi.org/10.1117/12.2180891
Event: International Symposium on Precision Engineering Measurement and Instrumentation, 2014, Changsha/Zhangjiajie, China
Abstract
A sample-titling strategy is proposed for the correction of the relative slope of microstructures and the scanning stylus during the surface profile measurement of microstructures with steep slopes. The correct surface profile of a measurement sample was reconstructed by data fusion of the probe trace, rotation angles of a sample and the motion of the scanner. Slope prediction and scanner control methods were also proposed to determine the rotation angle of a sample. Simulation was performed using a stylus with a tip of 2 μm and included angle of 90 degrees, and a trapezoid microstructure with a slope of 60 degrees to verify the feasibility of the proposed method. The measurement error of the proposed method is 0.31 μm while that of an existing scanning method is 4.50 μm in the simulation. Simulation results indicated that the proposed method could be used to increase the maximum detectable slope of a stylus profiling system and to reduce slope measurement errors as well.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bin Xu, Bin Xu, Wei Chen, Wei Chen, Yubo Huang, Yubo Huang, Kang Song, Kang Song, Shiping Zhao, Shiping Zhao, } "Surface profile measurement of microstructures with steep slopes by sample-titling strategy", Proc. SPIE 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation, 944623 (6 March 2015); doi: 10.1117/12.2180891; https://doi.org/10.1117/12.2180891
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