19 March 2015 Spectral reflectance modeling of ZnO layers made with Atomic Layer Deposition for application in optical fiber Fabry-Perot interferometric sensors
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Abstract
Suitability of zinc oxide (ZnO) layers grown using Atomic Layer Deposition for operation in optical-fiber extrinsic Fabry-Perot sensors is investigated using a numerical model. Reflectance spectra obtained using the developed model indicate that the application of these layers in optical-fiber extrinsic Fabry-Perot sensors is difficult as it may require a source whose spectrum width is about 300 nm. A series of ZnO layers grown on end faces of SMF-28 fiber were prepared and their reflectance spectra were recorded by an optical spectrum analyser in order to verify the modelling results. The spectra contain a series of peaks not predicted by the model, which is attributed to two-mode propagation in the SMF-28 fiber connecting the ZnO layer with the rest of the measurement system.
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Paweł Wierzba, Paweł Wierzba, Małgorzata Jędrzejewska-Szczerska, Małgorzata Jędrzejewska-Szczerska, } "Spectral reflectance modeling of ZnO layers made with Atomic Layer Deposition for application in optical fiber Fabry-Perot interferometric sensors", Proc. SPIE 9448, Saratov Fall Meeting 2014: Optical Technologies in Biophysics and Medicine XVI; Laser Physics and Photonics XVI; and Computational Biophysics, 944819 (19 March 2015); doi: 10.1117/12.2179963; https://doi.org/10.1117/12.2179963
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