Paper
19 February 2015 Riesz transforms in statistical signal processing and their applications to speckle metrology: a review
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Proceedings Volume 9449, The International Conference on Photonics and Optical Engineering (icPOE 2014); 944904 (2015) https://doi.org/10.1117/12.2081318
Event: The International Conference on Photonics and Optical Engineering and the Annual West China Photonics Conference (icPOE 2014), 2014, Xi'an, China
Abstract
In this paper, a high-dimensional statistical signal processing is revisited with the aim of introducing the concept of vector signal representation derived from the Riesz transforms, which are the natural extension and generalization of the one-dimensional Hilbert transform. Under the new concepts of vector correlations proposed recently, the statistical properties of the vector signal representation for random signal are presented and some applications to speckle metrology developed recently are reviewed to demonstrate the unique capability of Riesz transforms.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wei Wang, Shun Zhang, Ning Ma, Steen G. Hanson, and Mitsuo Takeda "Riesz transforms in statistical signal processing and their applications to speckle metrology: a review", Proc. SPIE 9449, The International Conference on Photonics and Optical Engineering (icPOE 2014), 944904 (19 February 2015); https://doi.org/10.1117/12.2081318
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KEYWORDS
Transform theory

Speckle pattern

Signal analyzers

Speckle

Signal processing

Statistical analysis

Signal generators

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