The characteristic analysis of spectral image for cabbage leaves damaged by diamondback moth pests

Li-bo Lin; Hong-ning Li; Peng-fei Cao; Feng Qin; Shu-ming Yang; Jie Feng

doi:10.1117/12.2075908

19 February 2015 The characteristic analysis of spectral image for cabbage leaves damaged by diamondback moth pests

Li-bo Lin, Hong-ning Li, Peng-fei Cao, Feng Qin, Shu-ming Yang, Jie Feng

Proceedings Volume 9449, The International Conference on Photonics and Optical Engineering (icPOE 2014); 94490T (2015) https://doi.org/10.1117/12.2075908
Event: The International Conference on Photonics and Optical Engineering and the Annual West China Photonics Conference (icPOE 2014), 2014, Xi'an, China

Abstract

Cabbage growth and health diagnosis are important parts for cabbage fine planting, spectral imaging technology with the advantages of obtaining spectrum and space information of the target at the same time, which has become a research hotspot at home and abroad. The experiment measures the reflection spectrum at different stages using liquid crystal tunable filter (LCTF) and monochromatic CMOS camera composed of spectral imaging system for cabbage leaves damaged by diamondback moth pests, and analyzes its feature bands and the change of spectral parameters. The study shows that the feature bands of cabbage leaves damaged by diamondback moth pests have a tendency to blue light direction, the red edge towards blue shift, and red valley raising in spectral characteristic parameters, which have a good indication in diagnosing the extent of cabbage damaged by pests. Therefore, it has a unique advantage of monitoring the cabbage leaves damaged by diamondback moth pests by combinating feature bands and spectral characteristic parameters in spectral imaging technology.

Citation Download Citation

Li-bo Lin, Hong-ning Li, Peng-fei Cao, Feng Qin, Shu-ming Yang, and Jie Feng "The characteristic analysis of spectral image for cabbage leaves damaged by diamondback moth pests", Proc. SPIE 9449, The International Conference on Photonics and Optical Engineering (icPOE 2014), 94490T (19 February 2015); https://doi.org/10.1117/12.2075908

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