Translator Disclaimer
19 February 2015 Transmission loss in x-ray framing cameras
Author Affiliations +
Proceedings Volume 9449, The International Conference on Photonics and Optical Engineering (icPOE 2014); 94491K (2015) https://doi.org/10.1117/12.2077374
Event: The International Conference on Photonics and Optical Engineering and the Annual West China Photonics Conference (icPOE 2014), 2014, Xi'an, China
Abstract
We present evidence that transmission loss in gated x-ray framing cameras can affect relative gains. Transmission loss is caused by a variety of factors including: incident voltage waveform, matched load, width of Au electrode gap, and so on. The transition electrode in MCP (Micro-channel Plate) is continuous gradual change line, and it has good capability of compensation. When continuous gradual change micro-strip line is designed, dielectric loss tangent is one of transmission loss factors too. The model structure is designed based on the analysis of modeling and simulation techniques and experiment data as well as forecast target. The transmission loss is reduced from 50% to 25%, the transmission efficiency is greatly improved.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xiaohong Bai, BingLi Zhu, Yonglin Bai, Yongsheng Gou, Peng Xu, Jing Jin, Bo Wang, Baiyu Liu, and Junjun Qin "Transmission loss in x-ray framing cameras", Proc. SPIE 9449, The International Conference on Photonics and Optical Engineering (icPOE 2014), 94491K (19 February 2015); https://doi.org/10.1117/12.2077374
PROCEEDINGS
7 PAGES


SHARE
Advertisement
Advertisement
RELATED CONTENT


Back to Top