6 January 2015 SEM and AFM imaging of solar cells defects
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Proceedings Volume 9450, Photonics, Devices, and Systems VI; 94501M (2015) https://doi.org/10.1117/12.2049046
Event: Photonics Prague 2014, 2014, Prague, Czech Republic
Abstract
The paper deals with the successive localization and imaging of solar cell defects, going from macroscale to microscale. For the purpose of localization, the light emission from reversed bias samples is used. After rough macroscopic localization, microscopic localization by scanning probe microscopy combined with a photomultiplier (shadow mapping) is performed. The type of microscopic defects are discernable from their current-voltage plot or from noise measurements. Two specific defects, both of the avalanche type, with different voltage threshold, are presented in this paper. Current voltage plots and radiant flux versus voltage characteristics for two temperatures, topography, shadow map and corresponding SEM micrographs are shown for both samples.
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Pavel Škarvada, Robert Macků, Dinara S. Dallaeva, Petr Sedlák, Lubomír Grmela, Pavel Tománek, "SEM and AFM imaging of solar cells defects", Proc. SPIE 9450, Photonics, Devices, and Systems VI, 94501M (6 January 2015); doi: 10.1117/12.2049046; https://doi.org/10.1117/12.2049046
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