14 May 2015 The use of short and wide x-ray pulses for time-of-flight x-ray Compton Scatter Imaging in cargo security
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Abstract
Using a short pulse width x-ray source and measuring the time-of-flight of photons that scatter from an object under inspection allows for the point of interaction to be determined, and a profile of the object to be sampled along the path of the beam. A three dimensional image can be formed by interrogating the entire object. Using high energy x rays enables the inspection of cargo containers with steel walls, in the search for concealed items. A longer pulse width x-ray source can also be used with deconvolution techniques to determine the points of interaction. We present time-of-flight results from both short (picosecond) width and long (hundreds of nanoseconds) width x-ray sources, and show that the position of scatter can be localised with a resolution of 2 ns, equivalent to 30 cm, for a 3 cm thick plastic test object.
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Nick Calvert, Nick Calvert, Marta M. Betcke, Marta M. Betcke, John R. Cresswell, John R. Cresswell, Alick N. Deacon, Alick N. Deacon, Anthony J. Gleeson, Anthony J. Gleeson, Daniel S. Judson, Daniel S. Judson, Peter Mason, Peter Mason, Peter A. McIntosh, Peter A. McIntosh, Edward J. Morton, Edward J. Morton, Paul J. Nolan, Paul J. Nolan, James Ollier, James Ollier, Mark G. Procter, Mark G. Procter, Robert D. Speller, Robert D. Speller, } "The use of short and wide x-ray pulses for time-of-flight x-ray Compton Scatter Imaging in cargo security", Proc. SPIE 9456, Sensors, and Command, Control, Communications, and Intelligence (C3I) Technologies for Homeland Security, Defense, and Law Enforcement XIV, 945604 (14 May 2015); doi: 10.1117/12.2176832; https://doi.org/10.1117/12.2176832
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