A gallery approach for off-angle iris recognition

Mahmut Karakaya; Rashiduddin Yoldash; Christopher Boehnen

doi:10.1117/12.2176731

15 May 2015 A gallery approach for off-angle iris recognition

Mahmut Karakaya, Rashiduddin Yoldash, Christopher Boehnen

Proceedings Volume 9457, Biometric and Surveillance Technology for Human and Activity Identification XII; 945708 (2015) https://doi.org/10.1117/12.2176731
Event: SPIE Defense + Security, 2015, Baltimore, MD, United States

Abstract

It has been proven that hamming distance score between frontal and off-angle iris images of same eye differs in iris recognition system. The distinction of hamming distance score is caused by many factors such as image acquisition angle, occlusion, pupil dilation, and limbus effect. In this paper, we first study the effect of the angle variations between iris plane and the image acquisition systems. We present how hamming distance changes for different off-angle iris images even if they are coming from the same iris. We observe that increment in acquisition angle of compared iris images causes the increment in hamming distance. Second, we propose a new technique in off-angle iris recognition system that includes creating a gallery of different off-angle iris images (such as, 0, 10, 20, 30, 40, and 50 degrees) and comparing each probe image with these gallery images. We will show the accuracy of the gallery approach for off-angle iris recognition.

Citation Download Citation

Mahmut Karakaya, Rashiduddin Yoldash, and Christopher Boehnen "A gallery approach for off-angle iris recognition", Proc. SPIE 9457, Biometric and Surveillance Technology for Human and Activity Identification XII, 945708 (15 May 2015); https://doi.org/10.1117/12.2176731

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KEYWORDS

Iris recognition

Image segmentation

Image acquisition

Cameras

Biometrics

Eye

Refraction

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