28 May 2015 Ramification algorithm for graphene sample-defect localization
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Abstract
Recent development of a new 2D material graphene necessitates sample characterization (in particular localization and distribution of defects). The presence of defects is unavoidable, however, it is possible to determine and predict defect distribution in graphene samples prior to the actual device making. A ramification algorithm is used for the above purpose.
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Andre Sokolnikov, Andre Sokolnikov, } "Ramification algorithm for graphene sample-defect localization", Proc. SPIE 9476, Automatic Target Recognition XXV, 947611 (28 May 2015); doi: 10.1117/12.2180380; https://doi.org/10.1117/12.2180380
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