13 May 2015 Advanced computational sensors technology: testing and evaluation in visible, SWIR, and LWIR imaging
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Abstract
The Advanced Computational Sensors Team at the Johns Hopkins University Applied Physics Laboratory and the Johns Hopkins University Department of Electrical and Computer Engineering has been developing advanced readout integrated circuit (ROIC) technology for more than 10 years with a particular focus on the key challenges of dynamic range, sampling rate, system interface and bandwidth, and detector materials or band dependencies. Because the pixel array offers parallel sampling by default, the team successfully demonstrated that adding smarts in the pixel and the chip can increase performance significantly. Each pixel becomes a smart sensor and can operate independently in collecting, processing, and sharing data. In addition, building on the digital circuit revolution, the effective well size can be increased by orders of magnitude within the same pixel pitch over analog designs. This research has yielded an innovative class of a system-on-chip concept: the Flexible Readout and Integration Sensor (FRIS) architecture. All key parameters are programmable and/or can be adjusted dynamically, and this architecture can potentially be sensor and application agnostic. This paper reports on the testing and evaluation of one prototype that can support either detector polarity and includes sample results with visible, short-wavelength infrared (SWIR), and long-wavelength infrared (LWIR) imaging.
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Charbel G. Rizk, Charbel G. Rizk, John P. Wilson, John P. Wilson, Philippe Pouliquen, Philippe Pouliquen, } "Advanced computational sensors technology: testing and evaluation in visible, SWIR, and LWIR imaging", Proc. SPIE 9481, Image Sensing Technologies: Materials, Devices, Systems, and Applications II, 94810E (13 May 2015); doi: 10.1117/12.2177350; https://doi.org/10.1117/12.2177350
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