13 May 2015 Non-uniformity correction with temperature influence compensation in microbolometer detector
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Abstract
Because of a significant impact of the microbolometer array temperature on the infrared image quality, it is necessary to compensate the influence of the temperature on the NUC process. In the most common applications two approaches are used: the first is a stabilization of the microbolometer array temperature by a thermoelectric cooler, the second is updating correction coefficients obtained from reference source, for example a shutter [14]. Both of the most common approaches have theirs disadvantages. The first case needs a considerable amount of energy for temperature stabilisation. The second one needs a reference target and a mechanical procedure to place the target at the front of the detector. Additionally, during calibration the reference target is blocking radiation from the scene, thus interrupting measurements with the thermal camera. In the article a non-uniformity correction method is presented which allows to compensate for the influence of detector’s temperature drift. For this purpose, dependency between output signal value and the temperature of the detector array was investigated. Additionally the influence of the temperature on the Offset and Gain coefficients was measured. Presented method utilizes estimated dependency between output signal of detectors and their temperature. In the presented method, the dependency between output signal value and the temperature of the detector is estimated during time of starting detector. The coefficients are estimated for every pixel. In the article proposed method allows to compensate the influence of detectors temperature fluctuation and increase a time between shutter actuation process.
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Michał Krupiński, Michał Krupiński, Grzegorz Bieszczad, Grzegorz Bieszczad, Sławomir Gogler, Sławomir Gogler, Henryk Madura, Henryk Madura, } "Non-uniformity correction with temperature influence compensation in microbolometer detector", Proc. SPIE 9481, Image Sensing Technologies: Materials, Devices, Systems, and Applications II, 948113 (13 May 2015); doi: 10.1117/12.2184645; https://doi.org/10.1117/12.2184645
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