Transmission imaging measurements at 188 GHz with 0.35µn CMOS technology

Andrew P. Sacco; J. Daniel Newman; Paul P. K. Lee; Kenneth D. Fourspring; John H. Osborn; Robert D. Fiete; Mark V. Bocko; Zeljko Ignjatovic; Judith L. Pipher; Craig W. McMurtry; Xi-Cheng Zhang; Jagannath Dayalu; Katherine Seery; Chao X. Zhang; Sahil Bhandari; Zoran Ninkov

doi:10.1117/12.2178512

13 May 2015 Transmission imaging measurements at 188 GHz with 0.35μm CMOS technology

Andrew P. Sacco, J. Daniel Newman, Paul P. K. Lee, Kenneth D. Fourspring, John H. Osborn, Robert D. Fiete, Mark V. Bocko, Zeljko Ignjatovic, Judith L. Pipher, Craig W. McMurtry, Xi-Cheng Zhang, Jagannath Dayalu, Katherine Seery, Chao X. Zhang, Sahil Bhandari, Zoran Ninkov

Author Affiliations +

Proceedings Volume 9483, Terahertz Physics, Devices, and Systems IX: Advanced Applications in Industry and Defense; 94830U (2015) https://doi.org/10.1117/12.2178512
Event: SPIE Sensing Technology + Applications, 2015, Baltimore, MD, United States

Abstract

Exelis Geospatial Systems and its CEIS partners at the University of Rochester and Rochester Institute of Technology are developing an active THz imaging system for use in standoff detection, molecular spectroscopy and penetration imaging. The current activity is focused on developing a precision instrument for the detection of radiation centered on atmospheric windows between 200 GHz and 400 GHz (available sources). A transmission imager is developed by raster scanning through a semi-coherent non-ionizing beam, where the beam is incident on a NMOS FET detector. The primary goal of the initial system is to produce a setup capable of measuring responsivity and sensitivity of the detector. The Instrumentation covers the electromagnetic spectral range between 188 GHz and 7.0 THz. Transmission measurements are collected at 188 GHz in order to verify image formation, responsivity and sensitivity as well as demonstrate the active imager’s ability to make penetration images.

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Andrew P. Sacco, J. Daniel Newman, Paul P. K. Lee, Kenneth D. Fourspring, John H. Osborn, Robert D. Fiete, Mark V. Bocko, Zeljko Ignjatovic, Judith L. Pipher, Craig W. McMurtry, Xi-Cheng Zhang, Jagannath Dayalu, Katherine Seery, Chao X. Zhang, Sahil Bhandari, and Zoran Ninkov "Transmission imaging measurements at 188 GHz with 0.35μm CMOS technology", Proc. SPIE 9483, Terahertz Physics, Devices, and Systems IX: Advanced Applications in Industry and Defense, 94830U (13 May 2015); https://doi.org/10.1117/12.2178512

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KEYWORDS

Sensors

Antennas

Imaging systems

Terahertz radiation

Solids

CMOS technology

Signal detection

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