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This PDF file contains the front matter associated with SPIE Proceedings Volume 9489 including the Title Page, Copyright information, Table of Contents, Introduction, and Conference Committee listing.

The papers included in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. The papers published in these proceedings reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from this book:

Author(s), “Title of Paper,” in Dimensional Optical Metrology and Inspection for Practical Applications IV, edited by Kevin G. Harding, Toru Yoshizawa, Song Zhang, Proceedings of SPIE Vol. 9489 (SPIE, Bellingham, WA, 2015) Article CID Number.

ISSN: 0277-786X

ISBN: 9781628416053

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Paper Numbering: Proceedings of SPIE follow an e-First publication model, with papers published first online and then in print. Papers are published as they are submitted and meet publication criteria. A unique citation identifier (CID) number is assigned to each article at the time of the first publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online, print, and electronic versions of the publication. SPIE uses a six-digit CID article numbering system in which:

  • The first four digits correspond to the SPIE volume number.

  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc.

The CID Number appears on each page of the manuscript. The complete citation is used on the first page, and an abbreviated version on subsequent pages.


Numbers in the index correspond to the last two digits of the six-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first four digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Afrough, Mohsen, 0G

Albert, Sven, 0G

Amiri, Javad, 04

Arai, Y., 0F

Azer, Magdi, 09

Bedi, Vijit, 0J

Breitbarth, Andreas, 03

Cai, Guoshuang, 09

Chen, Xiaobin, 09

Chen, Yung-Hsiang, 0O

Darudi, Ahmad, 04

Denzler, Joachim, 03

Dhadwal, Harbans S., 0N

Dickman, Corey J., 0B

Du, Xiaoming, 05

Feng, Dake, 0N

Foster, Bryant K., 0B

Hall, Benjamin T., 0B

Han, Xu, 07

Harding, Kevin G., 05, 07, 08, 09, 0L, 0M

Hwang, Chi-Hung, 0O

Jia, Ming, 07

Jia, Tao, 05

Kane, Timothy, 0E

Khandekar, Rahul, 0J

Kizilkaya, Serdar, 0E

Kühmstedt, Peter, 03

Laflen, Brandon, 07

Langehanenberg, P., 0C

Liao, Yi, 05, 0M

Lin, Chun-Fu, 0O

Liu, Yong, 09

Lucas, Vincent, 05

Lueerss, B., 0C

Müller, Eric, 03

Nafis, Chris, 08

Nassar, Abdalla R., 0B

Nehmetallah, Georges, 04

Nikulin, Vladimir V., 0J

Notni, Gunther, 03

Paul, Ratnadeep, 05

Rahman, Anis, 0H

Rahman, Aunik, 0H

Ramamurthy, Rajesh, 05, 0M

Rastegar, Jahangir, 0N

Reutzel, Edward W., 0B

Schott, Robert, 0G

Soltani, Peyman, 04

Song, Guiju, 07, 0L

Straub, Jeremy, 0D

Tait, Robert, 08, 09

Tator, Kenneth, 0H

Tusch, Jan, 0G

Walters, Gage, 0E

Wang, Wei-Chung, 0O

Wiedenmann, Ernst, 0G

Wolf, Andreas, 0G

Xie, Guangping, 07

Yang, Yong, 0L

Zhang, Song, 02

Conference Committee

Symposium Chair

  • Wolfgang Schade, Clausthal University of Technology (Germany) and Fraunhofer Heinrich-Hertz Institute (Germany)

Symposium Co-Chair

  • Ming C. Wu, University of California, Berkeley (United States)

Conference Chairs

  • Kevin G. Harding, GE Global Research (United States)

    Toru Yoshizawa, NPO 3D Associates (Japan)

Conference Co-Chair

  • Song Zhang, Purdue University (United States)

Conference Program Committee

  • Yasuhiko Arai, Kansai University (Japan)

  • Anand Krishna Asundi, Nanyang Technological University (Singapore)

  • Khaled J. Habib, Kuwait Institute for Scientific Research (Kuwait)

  • Katsuichi Kitagawa, Consultant (Japan)

  • Peter Kühmstedt, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)

  • Georges T. Nehmetallah, The Catholic University of America (United States)

  • Yukitoshi Otani, Utsunomiya University (Japan)

  • Xianyu Su, Sichuan University (China)

  • Takamasa Suzuki, Niigata University (Japan)

  • Joseph D. Tobiason, Micro Encoder Inc. (United States)

  • Jiangtao Xi, University of Wollongong (Australia)

Session Chairs

  • 1 Metrology Analysis

    Toru Yoshizawa, NPO 3D Associates (Japan)

  • 2 3D Applications

    Song Zhang, Purdue University (United States)

  • 3 Metrology for Additive Manufacturing

    Edward W. Reutzel, Applied Research Laboratory (United States)

  • 4 Advanced Topics

    Yukitoshi Otani, Utsunomiya University (Japan)

  • 5 3D and Imaging Methods

    Kevin G. Harding, GE Global Research (United States)

© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 9489", Proc. SPIE 9489, Dimensional Optical Metrology and Inspection for Practical Applications IV, 948901 (4 June 2015);

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