19 May 2015 Long wave infrared 3D scanner
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Abstract
In industrial metrology, the system of fringe projection for the fast determination of 3D surface data has been established. The combination of areal and structured projection with two-dimensional optical sensors and triangulation measurement principle allows very high measurement point densities with reasonable accuracy. There are great difficulties with high gloss surfaces and with very dark surfaces for state of the art systems. Transparent materials cannot be measured using the visible spectrum of light. We have therefore developed a new structured light projection system that solves these problems. For the first time the physical principle of energy conversion is utilized in areal structured light projection. We are presenting first results to show the advantages and the capability of this new measurement principle.
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Ernst Wiedenmann, Ernst Wiedenmann, Mohsen Afrough, Mohsen Afrough, Sven Albert, Sven Albert, Robert Schott, Robert Schott, Jan Tusch, Jan Tusch, Andreas Wolf, Andreas Wolf, } "Long wave infrared 3D scanner", Proc. SPIE 9489, Dimensional Optical Metrology and Inspection for Practical Applications IV, 94890G (19 May 2015); doi: 10.1117/12.2076111; https://doi.org/10.1117/12.2076111
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