The omni-directional image assisted optical surveillance system

Yung-Hsiang Chen; Chi-Hung Hwang; Wei-Chung Wang; Chun-Fu Lin

doi:10.1117/12.2176557

14 May 2015 The omni-directional image assisted optical surveillance system

Yung-Hsiang Chen, Chi-Hung Hwang, Wei-Chung Wang, Chun-Fu Lin

Author Affiliations +

Proceedings Volume 9489, Dimensional Optical Metrology and Inspection for Practical Applications IV; 94890O (2015) https://doi.org/10.1117/12.2176557
Event: SPIE Sensing Technology + Applications, 2015, Baltimore, Maryland, United States

Abstract

This paper presents a high resolution optical surveillance system which integrated an omni-directional imager as an event finder/ system trigger. The omni-directional optics, a fish-eye camera in this study, provides a wider field of view (FOV) which can monitor widely range continuously without scanning mechanism but offers sufficient information which includes sign of field event and direction and then drive high resolution surveillance camera for detail imaging. To archive an optical triggering surveillance system, the scale-invariant feature transform (SIFT) is implemented to detect features both from images taken by omni-directional imager and the high resolution surveillance camera. Considering the FOV of high resolution surveillance system is narrow, to ensure the pointing of high resolution surveillance system, feature matching is also implemented in this system to identify the images obtained by high resolution surveillance system are identical to the existing omni-directional image obtained from fish-eye camera. This provides a robust and accurate solution to the problem of optical radar surveillance system localization in unknown environments. An experiment is performed on outdoor image sequences with demonstrating the efficiency of our algorithm.

Citation Download Citation

Yung-Hsiang Chen, Yung-Hsiang Chen, Chi-Hung Hwang, Chi-Hung Hwang, Wei-Chung Wang, Wei-Chung Wang, Chun-Fu Lin, Chun-Fu Lin, "The omni-directional image assisted optical surveillance system", Proc. SPIE 9489, Dimensional Optical Metrology and Inspection for Practical Applications IV, 94890O (14 May 2015); doi: 10.1117/12.2176557; https://doi.org/10.1117/12.2176557

ACCESS THE FULL ARTICLE

PERSONAL SIGN IN
Full access may be available with your subscription

Email or Username Forgot your username?

Password Forgot your password?

Show

Remember Email/Username on this computer

Remember Password

No SPIE account? Create an account
or Institutional Sign In via Shibboleth

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $14.40

Non-members: $18.00 ADD TO CART

Show All Keywords

Keywords/Phrases

Search In:

Publication Years