Transverse x-ray scattering on random rough surfaces

Ping Zhao

doi:10.1117/12.2180449

12 May 2015 Transverse x-ray scattering on random rough surfaces

Ping Zhao

Proceedings Volume 9510, EUV and X-ray Optics: Synergy between Laboratory and Space IV; 951009 (2015) https://doi.org/10.1117/12.2180449
Event: SPIE Optics + Optoelectronics, 2015, Prague, Czech Republic

Abstract

This paper presents a new method to model the transverse scattering from random rough surfaces. It uses the same approach as our 2003 SPIE paper – PZ and LVS,¹ but considers the scattering in the direction perpendicular to the incident plane. For a given Power Spectral Density, a model surface is constructed by assigning a random phase to each spectral component. The incident wave is reflected from the model rough surface and then projected to an outgoing wavefront, which is then redistributed onto an even grid in the transverse direction, with corrections for the wave densities and the phase shifts. Fast Fourier transforms are used to calculate the transverse scattering pattern. This method provides the exact solution to the transverse scattering without small angle approximation. This solution is generally applicable to any transverse wave scatterings on random rough surfaces and is not limited to small scattering angles. This paper together with PZ and LVS¹ provide a complete solution for wave scattering on random rough surfaces in all directions. Examples are given for the Chandra X-ray Observatory optics. This method is also useful for the next generation X-ray astronomy missions.

Citation Download Citation

Ping Zhao "Transverse x-ray scattering on random rough surfaces", Proc. SPIE 9510, EUV and X-ray Optics: Synergy between Laboratory and Space IV, 951009 (12 May 2015); https://doi.org/10.1117/12.2180449

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